JPH01104033U - - Google Patents

Info

Publication number
JPH01104033U
JPH01104033U JP19669687U JP19669687U JPH01104033U JP H01104033 U JPH01104033 U JP H01104033U JP 19669687 U JP19669687 U JP 19669687U JP 19669687 U JP19669687 U JP 19669687U JP H01104033 U JPH01104033 U JP H01104033U
Authority
JP
Japan
Prior art keywords
chip
integrated circuits
temperature
temperature difference
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19669687U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19669687U priority Critical patent/JPH01104033U/ja
Publication of JPH01104033U publication Critical patent/JPH01104033U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP19669687U 1987-12-25 1987-12-25 Pending JPH01104033U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19669687U JPH01104033U (en]) 1987-12-25 1987-12-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19669687U JPH01104033U (en]) 1987-12-25 1987-12-25

Publications (1)

Publication Number Publication Date
JPH01104033U true JPH01104033U (en]) 1989-07-13

Family

ID=31487294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19669687U Pending JPH01104033U (en]) 1987-12-25 1987-12-25

Country Status (1)

Country Link
JP (1) JPH01104033U (en])

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